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Simulating the exposure of ICs to voltage surges caused by nuclear explosions

✍ Scribed by K. A. Epifantsev; O. A. Gerasimchuk; P. K. Skorobogatov


Book ID
110214403
Publisher
Springer
Year
2009
Tongue
English
Weight
224 KB
Volume
38
Category
Article
ISSN
1063-7397

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