✦ LIBER ✦
Simulating IC reliability with emphasis on process-flaw related early failures
✍ Scribed by Moosa, M.S.; Poole, K.F.
- Book ID
- 114555462
- Publisher
- IEEE
- Year
- 1995
- Tongue
- English
- Weight
- 713 KB
- Volume
- 44
- Category
- Article
- ISSN
- 0018-9529
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