Simulated electron beam trajectories toward a field ion microscopy specimen

✍ Scribed by D.J. Larson; P.P. Camus; T.F. Kelly

• Publisher: Elsevier Science
• Year: 1993
• Tongue: English
• Weight: 470 KB
• Volume: 67
• Category: Article
• ISSN: 0169-4332
• DOI: 10.1016/0169-4332(93)90355-f