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SIMS / XPS studies of the passive film on nickel

✍ Scribed by S.C. Tjong

Book ID: 113186365
Publisher: Elsevier Science
Year: 1982
Tongue: English
Weight: 343 KB
Volume: 17
Category: Article
ISSN: 0025-5408
DOI: 10.1016/0025-5408(82)90165-9

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