𝔖 Bobbio Scriptorium
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SIMS study of deuterium distribution in chemically charged aluminum containing oxide layer defects and trapping sites

✍ Scribed by P. Rozenak; B. Ladna; H.K. Birnbaum


Book ID
116599788
Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
662 KB
Volume
415
Category
Article
ISSN
0925-8388

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