SIMS microprofiles of Pb5%Sn solder joints in electronic devices after accelerated life tests : Scandurra, A., Porto, A. and Puglisi, O. Appl. Surf. Sci. (1995) 89 (1), 1–10

• Book ID: 103540325
• Publisher: Elsevier Science
• Year: 1996
• Tongue: English
• Weight: 64 KB
• Volume: 18
• Category: Article
• ISSN: 0142-1123
• DOI: 10.1016/0142-1123(96)82924-0