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SIMS as a subnanometer probe: A new tool for chemical profile analysis of grafted molecules

✍ Scribed by Frédéric Chérioux; Bernard Gauthier-Manuel; John Eccles; Thierry Grenut; Marc Briant


Publisher
Elsevier Science
Year
2007
Tongue
English
Weight
433 KB
Volume
253
Category
Article
ISSN
0169-4332

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