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Simple transmission ellipsometry method for measuring the electric-field-induced birefringence in PLZT thin films

✍ Scribed by J. Wang; D. Y. Wang; F. Li; X. G. Tang; H. L. W. Chan; D. Mo; C. L. Choy


Book ID
111590092
Publisher
Springer
Year
2004
Tongue
English
Weight
139 KB
Volume
39
Category
Article
ISSN
0022-2461

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