✦ LIBER ✦
Simple method to determine the si/sio2 fast interface trap density change after high field stress on silicon-on-insulator substrates
✍ Scribed by Calligaro, R.B.
- Book ID
- 114454259
- Publisher
- The Institution of Electrical Engineers
- Year
- 1987
- Weight
- 375 KB
- Volume
- 134
- Category
- Article
- ISSN
- 0143-7100
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