Simple goniometric search for electron microscopy

✍ Scribed by Correges, Philippe; Sors, Patrick; Dunant, Yves

• Publisher: John Wiley and Sons
• Year: 1997
• Tongue: English
• Weight: 101 KB
• Volume: 36
• Category: Article
• ISSN: 1059-910X
• DOI: 10.1002/(sici)1097-0029(19970301)36:5<440::aid-jemt15>3.0.co;2-s

✦ Synopsis

We developed a special software to memorize specific points on a grid for later fine analysis. This program is based on a goniometry search, and implemented on the PC coupled microscope. This allows automatic shifting of the grid, but it can also be programmed on a simple pocket calculator.