SIM Comparison of DC Resistance Standards at 1 , 1 , and 1

✍ Scribed by Jarrett, D.G.; Elmquist, R.E.; Nien Fan Zhang; Tonina, A.; Porfiri, M.; Fernandes, J.; Schechter, H.; Izquierdo, D.; Faverio, C.; Slomovitz, D.; Inglis, D.; Wendler, K.; Marquez, F.H.; Medina, B.R.

• Book ID: 114631024
• Publisher: IEEE
• Year: 2009
• Tongue: English
• Weight: 669 KB
• Volume: 58
• Category: Article
• ISSN: 0018-9456
• DOI: 10.1109/tim.2008.2008582