✦ LIBER ✦
Silver migration and the reliability of Pd/Ag conductors in thick-film dielectric crossover structures : Hussein M. Naguib and Blair K. MacLaurin. IEEE Trans. Components, Hybrids, Mfg Technol.Chmt-2, (2) 196 (June 1979)
- Book ID
- 103276787
- Publisher
- Elsevier Science
- Year
- 1980
- Tongue
- English
- Weight
- 137 KB
- Volume
- 20
- Category
- Article
- ISSN
- 0026-2714
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