✍ Scribed by Z. Balogh; Z. Erdélyi; D.L. Beke; A. Portavoce; C. Girardeaux; J. Bernardini; A. Rolland
No coin nor oath required. For personal study only.
Two to ten nanometer thick polycrystalline Pd films were prepared on the (1 1 1) surface of Ag single crystal and investigations of the Ag diffusion along Pd grain boundaries were carried out using the Hwang-Balluffi method. The samples were monitored by Auger electron spectroscopy (AES) during isothermal heat treatments in the 438-563 K temperature range. Using plausible simplifying assumptions, the activation energy of the product of the grain boundary (GB) diffusion coefficient and k 0 (k 0 = c s /c gb ; c s and c gb are the surface and GB concentration, respectively) was calculated (0.99 AE 0.08 eV) from the evaluated saturation coefficients of the surface accumulation. This energy, for weak temperature dependence of k 0 , is approximately equal to the activation energy of the GB diffusion.
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