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Silicon–carbide junction field effect transistor built-in diode: an experimentally verified electrical model

✍ Scribed by Salah, T.B.; Khachroumi, S.; Morel, H.


Book ID
120407061
Publisher
The Institution of Engineering and Technology
Year
2012
Tongue
English
Weight
758 KB
Volume
5
Category
Article
ISSN
1755-4535

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