✦ LIBER ✦
Silicon-wafer process evaluation using minority-carrier diffusion-length measurement by the SPV method : A. M. Goodman, L. A. Goodman and H. F. Gossenberger. RCA Rev.44, 326 (June 1983)
- Publisher
- Elsevier Science
- Year
- 1984
- Tongue
- English
- Weight
- 134 KB
- Volume
- 24
- Category
- Article
- ISSN
- 0026-2714
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