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Silicon supported lipid–DNA thin film structures at varying temperature studied by energy dispersive X-ray diffraction and neutron reflectivity

✍ Scribed by F. Domenici; C. Castellano; F. Dell’Unto; A. Albinati; A. Congiu


Book ID
113550395
Publisher
Elsevier Science
Year
2011
Tongue
English
Weight
714 KB
Volume
88
Category
Article
ISSN
0927-7765

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