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Silicon oxinitride and aluminum films interface: Rutherford backscattering and high resolution electron-energy-loss spectroscopic studies

โœ Scribed by M.D. Diatezua; P.A. Thiry; G. Terwagne; R. Caudano


Book ID
118365752
Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
472 KB
Volume
269-270
Category
Article
ISSN
0039-6028

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