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Silicon drift detectors for high resolution room temperature X-ray spectroscopy

✍ Scribed by Peter Lechner; Stefan Eckbauer; Robert Hartmann; Susanne Krisch; Dieter Hauff; Rainer Richter; Heike Soltau; Lothar Strüder; Carlo Fiorini; Emilio Gatti; Antonio Longoni; Marco Sampietro

Book ID: 107925291
Publisher: Elsevier Science
Year: 1996
Tongue: English
Weight: 418 KB
Volume: 377
Category: Article
ISSN: 0168-9002
DOI: 10.1016/0168-9002(96)00210-0

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