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Silicon detectors for digital radiography

โœ Scribed by F Arfelli; G Barbiellini; V Bonvicini; A Bravin; G Cantatore; E Castelli; L dalla Palma; M di Michiel; R Longo; A Olivo; P Poropat; M Prest; R Rosei; A Savoia; M Sessa; F Tomasini; G Tromba; A Vacchi

Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
429 KB
Volume
367
Category
Article
ISSN
0168-9002

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๐Ÿ“œ SIMILAR VOLUMES

Non-uniformity emendation technique for
Non-uniformity emendation technique for amorphous silicon flat-panel detectors used for industrial X-ray digital radiography
โœ Xiao Wang; Yan Han; Jinjuan Si ๐Ÿ“‚ Article ๐Ÿ“… 2008 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 791 KB

This paper proposes a non-uniformity emendation technique to solve the problem of non-linear of detector sensitivity for non-uniformity of amorphous silicon flat-panel detectors based on pixel sensitivity mean value. The technique corrects the testing image with the emendation factors obtained by th