Silicon-chromium thin-film resistor reliability: R K Waits, Abstracts. (Proc 19th Nat Symp Am Vac Soc) J Vac Sci Technol, 10 (1), Jan/Feb 1973, 285

• Publisher: Elsevier Science
• Year: 1973
• Tongue: English
• Weight: 141 KB
• Volume: 23
• Category: Article
• ISSN: 0042-207X
• DOI: 10.1016/0042-207x(73)92249-5