SILC-related effects in flash E2PROM's-Part II: Prediction of steady-state SILC-related disturb characteristics

✍ Scribed by de Blauwe, J.; van Heudt, J.; Wellekens, D.; Groeseneken, G.; Maes, H.E.

• Book ID: 114537392
• Publisher: IEEE
• Year: 1998
• Tongue: English
• Weight: 363 KB
• Volume: 45
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.704375