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SiL core edge fine structure in an oxidation series of silicon compounds: A comparison of microelectron energy loss spectra with theory

✍ Scribed by Skiff, W. M.; Carpenter, R. W.; Lin, S. H.


Book ID
120344346
Publisher
American Institute of Physics
Year
1985
Tongue
English
Weight
929 KB
Volume
58
Category
Article
ISSN
0021-8979

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