๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Significance of modifications in the expression for the mechanical surface impedance of panels at high wavenumbers

โœ Scribed by G. Maidanik; J. Dickey


Publisher
Elsevier Science
Year
1989
Tongue
English
Weight
756 KB
Volume
134
Category
Article
ISSN
0022-460X

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES


Atomic force microscopy and high-resolut
โœ Deenapanray, P. N. K.; Hillie, K. T.; Demanet, C. M.; Ridgway, M. C. ๐Ÿ“‚ Article ๐Ÿ“… 1999 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 353 KB ๐Ÿ‘ 2 views

The surface morphology and metallic contamination of magnetron sputter-etched Si(111) was investigated by atomic force microscopy (AFM) and high-resolution Rutherford backscattering spectroscopy (RBS) as a function of Ar plasma pressure. The root-mean-square roughness (R rms ) of plasma-etched Si de