✦ LIBER ✦

Signature analysis for analog and mixed-signal circuit test response compaction

✍ Scribed by Nagi, N.; Chatterjee, A.; Heebyung Yoon; Abraham, J.A.

Book ID: 119778331
Publisher: IEEE
Year: 1998
Tongue: English
Weight: 272 KB
Volume: 17
Category: Article
ISSN: 0278-0070
DOI: 10.1109/43.703834

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