Signal-to-noise ratio analysis of X-ray grating interferometry with the reverse projection extraction method

✍ Scribed by Wu, Z.; Wang, Z.L.; Gao, K.; Wang, D.J.; Wang, S.H.; Chen, J.; Chen, H.; Zhang, K.; Zhu, P.P.; Wu, Z.Y.

• Book ID: 122213109
• Publisher: Elsevier Science
• Year: 2014
• Tongue: English
• Weight: 806 KB
• Volume: 196
• Category: Article
• ISSN: 0368-2048
• DOI: 10.1016/j.elspec.2014.04.011