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Signal-to-noise and radiation exposure considerations in conventional and diffraction x-ray microscopy

โœ Scribed by Huang, Xiaojing; Miao, Huijie; Steinbrener, Jan; Nelson, Johanna; Shapiro, David; Stewart, Andrew; Turner, Joshua; Jacobsen, Chris


Book ID
115411551
Publisher
Optical Society of America
Year
2009
Tongue
English
Weight
597 KB
Volume
17
Category
Article
ISSN
1094-4087

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