Signal integrity and propagation delay analysis using FDTD technique for VLSI interconnects

✍ Scribed by Sharma, Devendra Kumar; Kaushik, Brajesh Kumar; Sharma, R. K.

• Book ID: 121546698
• Publisher: Springer
• Year: 2013
• Tongue: English
• Weight: 479 KB
• Volume: 13
• Category: Article
• ISSN: 1569-8025
• DOI: 10.1007/s10825-013-0527-y