✦ LIBER ✦
Signal Integrity and EMC/EMI Measurement Analysis of RF MEMS Devices via a Combined FETD/Higher Order FVTD Technique
✍ Scribed by Kantartzis, N.V.
- Book ID
- 114652843
- Publisher
- IEEE
- Year
- 2009
- Tongue
- English
- Weight
- 480 KB
- Volume
- 45
- Category
- Article
- ISSN
- 0018-9464
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