The approaches to thin film preparation
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K. Shirvani; M. Saremi; Y. Yamamoto
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Article
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2006
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John Wiley and Sons
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German
โ 113 KB
## Abstract Transmission electron microscopy (TEM) can be used as a precision characterization tool to identify very small precipitates in diffusion aluminide coatings. However, in order to successfully prepare the appropriate samples for TEM observation, often nonโtraditional thin film preparation