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Si migration effects in GaAs/(Al,Ga)As heterojunction and δ-doped structures

✍ Scribed by J.J. Harris; R.B. Beall; J.B. Clegg; C.T. Foxon; S.J. Battersby; D.E. Lacklison; G. Duggan; C.M. Hellon

No coin nor oath required. For personal study only.

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