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Short term instabilities of InGaN GaN light emitting diodes by capacitance–voltage characteristics and junction spectroscopy

✍ Scribed by A. Castaldini; A. Cavallini; L. Rigutti; M. Meneghini; S. Levada; G. Meneghesso; E. Zanoni; V. Härle; T. Zahner; U. Zehnder


Publisher
John Wiley and Sons
Year
2005
Tongue
English
Weight
189 KB
Volume
2
Category
Article
ISSN
1862-6351

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