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Shockley–Haynes Characterization of Minority-Carrier Drift Velocity, Diffusion Coefficient, and Lifetime in HgCdTe Avalanche Photodiodes

✍ Scribed by Johan Rothman; G. Vojetta; B. Moselle; L. Mollard; S. Gout; J.-P. Chamonal


Book ID
107456934
Publisher
Springer US
Year
2010
Tongue
English
Weight
566 KB
Volume
39
Category
Article
ISSN
0361-5235

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