✦ LIBER ✦

-shell ionization cross sections of Si by 3–25-keV electron impact using the thick-target method

✍ Scribed by Zhu, Jingjun; An, Zhu; Liu, Mantian; Tian, Lixia

Book ID: 121665873
Publisher: The American Physical Society
Year: 2009
Tongue: English
Weight: 407 KB
Volume: 79
Category: Article
ISSN: 1050-2947
DOI: 10.1103/PhysRevA.79.052710

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Thick-target method in the measurement o

Thick-target method in the measurement of inner-shell ionization cross-sections by low-energy electron impact

✍ Z. An; Y. Wu; M.T. Liu; Y.M. Duan; C.H. Tang 📂 Article 📅 2006 🏛 Elsevier Science 🌐 English ⚖ 184 KB

Effect of surface roughness on the measu

Effect of surface roughness on the measurement of electron impact inner-shell ionization cross sections using thick-target method

✍ LiXia Tian; Zhu An 📂 Article 📅 2008 🏛 Elsevier Science 🌐 English ⚖ 271 KB

Cross sections for K-shell ionization of

Cross sections for K-shell ionization of Si and Ar by 4 keV to 10 keV electron impact

✍ H. Platten; G. Schiwietz; G. Nolte 📂 Article 📅 1985 🏛 Elsevier Science 🌐 English ⚖ 236 KB

Experimental determination of cross sect

Experimental determination of cross sections for K-shell ionization by electron impact for C, O, Al, Si, and Ti

✍ Limandri, Silvina P.; Vasconcellos, M. A. Z.; Hinrichs, Ruth; Trincavelli, Jorge 📂 Article 📅 2012 🏛 The American Physical Society 🌐 English ⚖ 762 KB