✦ LIBER ✦
Shallow Trench Isolation Edge Effect on Random Telegraph Signal Noise and Implications for Flash Memory
✍ Scribed by Ruey-Ven Wang; Yung-Huei Lee; Yin-Lung Ryan Lu; McMahon, W.; Sam Hu; Ghetti, A.
- Book ID
- 114619702
- Publisher
- IEEE
- Year
- 2009
- Tongue
- English
- Weight
- 653 KB
- Volume
- 56
- Category
- Article
- ISSN
- 0018-9383
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