✦ LIBER ✦
SEU test techniques for 256 K static RAMs and comparisons of upsets by heavy ions and protons
✍ Scribed by Koga, R.; Kolasinski, W.A.; Osborn, J.V.; Elder, J.H.; Chitty, R.
- Book ID
- 114554649
- Publisher
- IEEE
- Year
- 1988
- Tongue
- English
- Weight
- 480 KB
- Volume
- 35
- Category
- Article
- ISSN
- 0018-9499
- DOI
- 10.1109/23.25512
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