Setting the stage for AFM
- Book ID
- 104450025
- Publisher
- Elsevier Science
- Year
- 2007
- Tongue
- English
- Weight
- 167 KB
- Volume
- 2
- Category
- Article
- ISSN
- 1748-0132
No coin nor oath required. For personal study only.
β¦ Synopsis
Instruments has introduced the nano-TA system to allow atomic force microscopes to image expansion, glass transition, softening, and melting at sub-100 nm resolution. Thermal probes are used to heat a localized area on the sample to up to 500ΒΊC at rates of up to 6000ΒΊC/min. These probes can be used on all microscopes in tapping, contact, pulsed force modes and also when collecting force curves. The nano-TA has applications in studies on polymers, thin films, and data storage materials.
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