✦ LIBER ✦
Sequential structural characterization of layers in the GaN/AlN/SiC/Si(111) system by X-ray diffraction upon every growth stage
✍ Scribed by Ratnikov, V. V.; Kalmykov, A. E.; Myasoedov, A. V.; Kukushkin, S. A.; Osipov, A. V.; Sorokin, L. M.
- Book ID
- 121594206
- Publisher
- SP MAIK Nauka/Interperiodica
- Year
- 2013
- Tongue
- English
- Weight
- 302 KB
- Volume
- 39
- Category
- Article
- ISSN
- 1063-7850
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