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Sequential maximum likelihood estimation for reflected Ornstein–Uhlenbeck processes

✍ Scribed by Chihoon Lee; Jaya P.N. Bishwal; Myung Hee Lee

Book ID: 113757613
Publisher: Elsevier Science
Year: 2012
Tongue: English
Weight: 275 KB
Volume: 142
Category: Article
ISSN: 0378-3758
DOI: 10.1016/j.jspi.2011.12.002

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