✦ LIBER ✦
Separation of effects of statistical impurity number fluctuations and position distribution on Vth fluctuations in scaled MOSFETs
✍ Scribed by Yasuda, Y.; Takamiya, M.; Hiramoto, T.
- Book ID
- 114538290
- Publisher
- IEEE
- Year
- 2000
- Tongue
- English
- Weight
- 430 KB
- Volume
- 47
- Category
- Article
- ISSN
- 0018-9383
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