✦ LIBER ✦

Sensivity of positron defect detection of surface layers

✍ Scribed by Professor P. U. Arifov; Dr. A. V. Shevchenko

Publisher: John Wiley and Sons
Year: 1988
Tongue: English
Weight: 252 KB
Volume: 23
Category: Article
ISSN: 0232-1300
DOI: 10.1002/crat.2170230327

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Defect detection within 0.4 mm of surfac

Defect detection within 0.4 mm of surface

📂 Article 📅 1972 🏛 Elsevier Science 🌐 English ⚖ 181 KB

A positron annihilation study of the for

A positron annihilation study of the formation of defect layers in cadmium mercury telluride

✍ A. Towner; P.C. Rice-Evans; N. Shaw 📂 Article 📅 1995 🏛 Elsevier Science 🌐 English ⚖ 272 KB

Positron annihilation studies of defects

Positron annihilation studies of defects in molecular beam epitaxy grown III–V layers

✍ M.T. Umlor; P. Asoka-Kumar; D.J. Keeble; P.W. Cooke; K.G. Lynn 📂 Article 📅 1995 🏛 Elsevier Science 🌐 English ⚖ 419 KB

Defect specific temperature dependence o

Defect specific temperature dependence of positron trapping

✍ S. Mantl; W. Kesternich; W. Triftshäuser 📂 Article 📅 1978 🏛 Elsevier Science 🌐 English ⚖ 260 KB

Defect analysis of NiMnSb epitaxial laye

Defect analysis of NiMnSb epitaxial layers

✍ L. Nowicki; A. Turos; A. Stonert; F. Garrido; L.W. Molenkamp; P. Bach; G. Schmid 📂 Article 📅 2005 🏛 Elsevier Science 🌐 English ⚖ 149 KB

NiMnSb layers grown on InP substrates with InGaAs buffer were studied by the backscattering/channeling spectrometry (RBS/C) with He beams. The nature of predominant defects observed in the layers was studied by determination of incident-energy dependence of the relative channeling yield. The defects

Positron studies of defect structures in

Positron studies of defect structures in metallic glasses

✍ E. Cartier; F. Heinrich; H.-J. Güntherodt 📂 Article 📅 1981 🏛 Elsevier Science 🌐 English ⚖ 353 KB