✦ LIBER ✦

Sensitivity of X-ray diffraction methods for the measurement of extended deformation fields

✍ Scribed by Dietrich, B.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Channelization of diffracted X-rays by s

✍ Dietrich, B. ;Kittner, R. 📂 Article 📅 1980 🏛 John Wiley and Sons 🌐 English ⚖ 143 KB

X-ray diffraction contrasts of section t

✍ Dietrich, B. ;Härtwig, J. ;Christoph, A. ;Hölzer, G. 📂 Article 📅 1981 🏛 John Wiley and Sons 🌐 English ⚖ 948 KB

Methods for X-ray diffraction analysis o

✍ Jeremy C Beauchamp; Neil W Isaacs 📂 Article 📅 1999 🏛 Elsevier Science 🌐 English ⚖ 86 KB

Continuous X-ray diffraction measurement

✍ Narayan R. Joshi; Robert E. Green 📂 Article 📅 1980 🏛 Springer 🌐 English ⚖ 792 KB

Anisotropic deformation of a crystal pla

✍ Härtwig, J. ;Lerche, V. 📂 Article 📅 1988 🏛 John Wiley and Sons 🌐 English ⚖ 617 KB

Diffraction method of measuring the geom

✍ L. P. Lazarev; S. D. Mirovitskaya 📂 Article 📅 1986 🏛 Springer US 🌐 English ⚖ 427 KB