Sensitivity of reliability-growth models to operational profile errors vs. testing accuracy [software testing]

✍ Scribed by Pasquini, A.; Crespo, A.N.; Matrella, P.

• Book ID: 114555573
• Publisher: IEEE
• Year: 1996
• Tongue: English
• Weight: 963 KB
• Volume: 45
• Category: Article
• ISSN: 0018-9529
• DOI: 10.1109/24.556576