Sensitivity-based optimization and statistical analysis of microwave semiconductor devices through multidimensional physical simulation (invited article)

✍ Scribed by Donati, Simona ;Bonani, Fabrizio ;Pirola, Marco ;Ghione, Giovanni

• Publisher: John Wiley and Sons
• Year: 1997
• Tongue: English
• Weight: 332 KB
• Volume: 7
• Category: Article
• ISSN: 1050-1827
• DOI: 10.1002/(sici)1522-6301(199701)7:1<129::aid-mmce9>3.0.co;2-q