Thin-film patterns were taken on a Rigaku D/ max 2500 W 18 kW system with a Cu Ka source (k = 1.54056 Γ ). AFM Measurements: Films were imaged on a Digital Instruments Multimode (AFMNS3A/BIOSCOPE) in air using tapping mode.
Semiconductor nanotube formation by a two-step template process
β Scribed by Dr. Patrick Hoyer
- Publisher
- John Wiley and Sons
- Year
- 1996
- Tongue
- English
- Weight
- 444 KB
- Volume
- 8
- Category
- Article
- ISSN
- 0935-9648
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