Semiconductor memories : technology, tes
β Ashok K Sharma; IEEE Solid-State Circuits Council
π Library
π
1996
π New Age Int'l.
π English
β¦ LIBER β¦
π
Semiconductor Memories: Technology, Testing, and Reliability
β Scribed by Ashok K. Sharma
- Publisher
- Wiley-IEEE Press
- Year
- 2002
- Tongue
- English
- Leaves
- 473
- Edition
- 1
- Category
- Library
β¬ Acquire This Volume
No coin nor oath required. For personal study only.
β¦ Synopsis
Semiconductor Memories provides in-depth coverage in the areas of design for testing, fault tolerance, failure modes and mechanisms, and screening and qualification methods including. Memory cell structures and fabrication technologies. Application-specific memories and architectures. Memory design, fault modeling and test algorithms, limitations, and trade-offs. Space environment, radiation hardening process and design techniques, and radiation testing.* Memory stacks and multichip modules for gigabyte storage.
β¦ Table of Contents
1......Page 1
2......Page 13
3......Page 22
4......Page 93
5......Page 152
6......Page 207
7......Page 261
8......Page 332
9......Page 399
10......Page 424
11......Page 462
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