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Semiconductor fault detection and classification for yield enhancement and manufacturing intelligence

โœ Scribed by Chien, Chen-Fu; Hsu, Chia-Yu; Chen, Pei-Nong

Book ID
121634236
Publisher
Springer US
Year
2012
Tongue
English
Weight
850 KB
Volume
25
Category
Article
ISSN
1936-6582

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โœ Y.-N. Shen; F. Lombardi ๐Ÿ“‚ Article ๐Ÿ“… 1990 ๐Ÿ› Springer US ๐ŸŒ English โš– 968 KB

In this article, yield enhancement and manufacturing throughput of large repairable memories are analyzed. These objectives are met by repairability/unrepairability detection. Initially two new techniques for detection of memory chips with redundancy are presented. Initially, a heuristic, yet effici