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Semiconductor characterization by scanning ion beam induced charge (IBIC) microscopy
✍ Scribed by E. Vittone; Z. Pastuovic; P. Olivero; C. Manfredotti; M. Jaksic; A. Lo Giudice; F. Fizzotti; E. Colombo
- Book ID
- 108224163
- Publisher
- Elsevier Science
- Year
- 2008
- Tongue
- English
- Weight
- 939 KB
- Volume
- 266
- Category
- Article
- ISSN
- 0168-583X
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