Semi-quantitative and non-destructive analysis of impurities at a buried interface: Na and the CdS/Cu(In,Ga)Se2 heterojunction

✍ Scribed by C. Heske; D. Eich; R. Fink; E. Umbach; T. van Buuren; C. Bostedt; S. Kakar; L. J. Terminello; M. M. Grush; T. A. Callcott; F. J. Himpsel; D. L. Ederer; R. C. C. Perera; W. Riedl; F. Karg

• Publisher: John Wiley and Sons
• Year: 2000
• Tongue: English
• Weight: 81 KB
• Volume: 30
• Category: Article
• ISSN: 0142-2421
• DOI: 10.1002/1096-9918(200008)30:1<459::aid-sia757>3.0.co;2-l