✦ LIBER ✦
Semi-Analytical Model for the Transient Operation of Gate-All-Around Charge-Trap Memories
✍ Scribed by Amoroso, S.M.; Monzio Compagnoni, C.; Mauri, A.; Maconi, A.; Spinelli, A.S.; Lacaita, A.L.
- Book ID
- 114620583
- Publisher
- IEEE
- Year
- 2011
- Tongue
- English
- Weight
- 303 KB
- Volume
- 58
- Category
- Article
- ISSN
- 0018-9383
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