SEM–EBIC investigation of silicon, compensated by zinc during high temperature diffusion annealing

✍ Scribed by E. B. Yakimov; V. V. Privezentsev

• Publisher: Springer US
• Year: 2008
• Tongue: English
• Weight: 322 KB
• Volume: 19
• Category: Article
• ISSN: 0957-4522
• DOI: 10.1007/s10854-008-9730-1